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◈ date : 2013/11/05
◈ time : 7 p.m.
◈ place : 7th building 5nd floor no. 502
◈ presenter : Jaeman Jang, Hyeongjung Kim
◈ papers :
-Unusual instability mode of transparent all oxide thin film transistor under dynamic bias condition
-Origin of self-heating effect induced asymmetrical degradation behavior in InGaZnO thin-film transistors